PhD dissertation

 

Anatomy of the SIFT Method Advisors: Jean-Michel Morel, Mauricio Delbracio Defended September 24, 2015 at the École Normale Supérieure Cachan

Pre-prints

 

Variations on the CSC model Ives Rey-Otero, Jeremias Sulam, Michael Elad arXiv preprint 1810.01169

Journals

 

Computing an Exact Gaussian Scale-Space Ives Rey-Otero, Mauricio Delbracio Image Processing On Line (IPOL), 2016. [web] [demo] [code] [bib]

 

Anatomy of the SIFT Method Ives Rey-Otero and Mauricio Delbracio Image Processing On Line (IPOL), 2014. [web] [demo] [code] [bib]

 

Is Repeatability an Unbiased Criterion for Ranking Feature Detectors? Ives Rey-Otero, Mauricio Delbracio SIAM Journal on Imaging Sciences (SIIMS), 2015 [preprint] [bib] [arXiv] [code]

 

An Analysis of the Factors Affecting Keypoint Stability in Scale-Space Ives Rey-Otero, Jean-Michel Morel, Mauricio Delbracio Journal of Mathematical Imaging and Vision, 2016 [preprint] [bib] [arXiv] [code]

Conferences

 

An analysis of scale-space sampling in SIFT Ives Rey-Otero, Jean-Michel Morel, Mauricio Delbracio International Conference on Image Processing (ICIP) 2014. Paper. Oral presentation. [preprint] [bib] [slides]

 

Comparing feature detectors: A bias in the repeatability criteria Ives Rey-Otero, Mauricio Delbracio, Jean-Michel Morel International Conference on Image Processing (ICIP) 2015. Paper. Oral presentation. [preprint] [bib] [slides]